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Scanning Electron Microscopes SU3800/SU3900

Hitachi electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.

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  • Hong Kong SAR

Hitachi Scanning Electron Microscopes SU3800/SU3900

The modern SEMs must be highly versatile and easy to use for all experience levels. Hitachi SU3800/SU3900 were designed to address these needs and more, Hitachi High-Technologies provides a novel solution with the SU3800/SU3900. Advanced automation functions including auto start, wide-angle camera navigation with stitching, and auto algorithms enable high-throughput, easy-to-use systems for both new and experienced operators. The oversized SU3900 features a class-leading specimen chamber/stage configuration with ability to accommodate a 300-mm sample diameter and loading capacity up to 5 kg. This allows for easy observation of very large samples without the need to cut or process prior to imaging

Main Features

(1) Handles large, heavy specimens

- The SU3800 can accommodate a specimen up to a 200-mm diameter with maximum height of 80 mm and weight of 2 kg.

- The SU3900 can accommodate a specimen up to a 300-mm diameter with maximum height of 130 mm and weight of 5 kg.

(2) Support for wide-area observations

- SEM MAP with camera navigation supports quick ROI targeting from wide-angle optical image.

- Multi Zigzag function allows for multi-frame stitch acquisition at user-selectable regions of interest, even from SEM MAP optical image.

(3) Improved operation through automation

- The automatic function for image adjustment reduces waiting time from start to acquisition.

- Intelligent Filament Technology (IFT) software automatically monitors and controls filament conditions as well as indicates the remaining filament life. This is advantageous for continuous observation over a long period of time or wide-area particle analysis.

Main Specifications:



Secondary Electron Image Resolution

3.0 nm (Accelerating Voltage: 30 kV, high vacuum mode)

15.0 nm (Accelerating Voltage: 1 kV, high vacuum mode)

Backscattered Electron Image Resolution

4.0 nm (Accelerating Voltage: 30kV, low vacuum mode)

Accelerating Voltage

0.3 to 30 kV


×5 to ×300,000 (photo magnification)

×7 to ×800,000 (actual display magnification)

Specimen Stage

X: 0 to 100 mm

Y: 0 to 50 mm

Z: 5 to 65 mm

T: -20° to 90°

R: 360°

X: 0 to 150 mm

Y: 0 to 150 mm

Z: 5 to 85 mm

T: -20° to 90°

R: 360°

Maximum Loadable Specimen Size

200 mm diameter

300 mm diameter

Maximum Observable Range

130 mm diameter (with rotation)

200 mm diameter (with rotation)

Maximum specimen height

80 mm (WD = 10 mm)

130mm (WD = 10 mm)

Product Video

Application: Metallic Materials, Ceramic Materials, Electronic Materials, Biology/Pharmaceutical Materials

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