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Scanning Electron Microscope S-3700N

The S-3700N is equipped with a secondary electron detector, a five-segment backscattered electron (BSE) detector and a variable pressure (VP) mode as its standard configuration. This allows observation of most samples in their natural state or in a wet condition, without the need for metal coating, which was required in the past with conventional SEM. The S-3700N has a huge sample chamber and can accommodate samples as large as 300 mm in diameter and 110 mm tall. A 5-axis motorized stage makes the large chamber ideal for a wide variety of samples. It also has many accessory ports to support the wide range of applications and future needs.

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Hitachi Scanning Electron Microscope S-3700N

The Scanning Electron Microscope (SEM) today is extending into an ever wider field of applications, not only in academic research, but in various industries as well, and associated with this trend, samples requiring observation and analysis also cover a wide spectrum of applications. The S-3700N was developed with these widely diversified applications in mind, which is equipped with a huge sample chamber, a 5-axis motorized stage, and user-friendly GUI design.


- The extra large chamber can accommodate samples up to 300 mm in diameter and EDX/WDX/EBSD accessories simultaneously. It also accommodates
samples as tall as 110 mm.
 A 5-axis motorized stage with eucentric tilt and rotation, an image navigation system, stage history, stage memory and click to center.
User-friendly GUI design
The display system allows a full-frame, flicker free, high pixel density, real-time image. It also allows simultaneous display of images from two different   detectors, each having different sample information, in real-time, including signal mixing.
 VP mode for observation of non-conductive samples without the need for metal coating.
 A high sensitivity semiconductor BSE detector that operates in a rapid scan mode. This makes finding areas of interest on large samples easy and convenient.
 Comes with a Turbo Molecular Pump (TMP) as standard equipment. This minimizes sample contamination due to its clean, dry vacuum conditions. Unlike conventional diffusion pumped SEM, the S-3700N does not require a large heating power or a water re-circulator, making it an energy-saving and ecological SEM

Application: Metal, Material Science, Semiconductors, EBSP analysis

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