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Rigaku EDXRF NEX DE VS
Rigaku EDXRF NEX DE VS - Elemental analysis by X-ray fluorescence, High performance, variable small spot EDXRF elemental analyzer
Download- Hong Kong SAR
Rigaku NEX DE VS with integrated camera and variable small
spot analysis
Energy dispersive X-ray fluorescence (EDXRF) is a routinely used
analytical technique for the qualitative and quantitative determination of
major and minor atomic elements in a wide variety of sample types. The heart of
its versatility stems from the ability to provide rapid, non-destructive,
multi-element analyses — from low parts-per-million (ppm) levels to high weight
percent (wt%) concentrations — for elements from sodium (11Na) through uranium
(92U). The versatile Rigaku NEX DE VS EDXRF spectrometer delivers routine
elemental measurements across a diverse range of matrices — from homogeneous
liquids of any viscosity to solids, thin films, alloys, slurries, powders and
pastes.
Elemental analysis in the field, plant or laboratory
Specially designed and engineered for heavy industrial use, whether on the
plant floor or in remote field environments, the superior analytical power,
flexibility and ease-of-use of the NEX DE VS adds to its broad appeal for an
ever expanding range of applications, including exploration, research, RoHS
inspection, and education, as well as industrial and production monitoring
applications. Whether the need is basic quality control (QC) or its more
sophisticated variants — such as analytical quality control (AQC), quality
assurance (QA) or statistical process control like Six Sigma — the NEX DE VS is
the reliable choice for routine elemental analysis.
Point Analysis interface, available in a variety of languages, is used
for small spot measurements. A live camera display is shown in the left window.