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Surface science
IXRF SDD - EDS and XRF detector for EM
IXRF's range of electronically cooled (LN free) Silicon Drift Detectors are optimized when coupled with an innovative ethernet based digital pulse processor. Specifically configured to each customer, IXRF SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid x-ray maps. DownloadOnline messages
Sale area:
  • Hong Kong SAR
  • China

The SDD detector is available in both EDS (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. Choices of window materials are available, from Beryllium (8μm) to Thin Polymer (for light element x-ray transmission) and sensor active areas of 10mm2 to 60mm2 are offered. In addition, all or our SEM SDD versions are vibration free.

 



Features:
-  Sensor Area 10mm2
30mm2, 60mm2, 100mm2
-  Window Options: Light Element (AP3.3) or 8μm Be
Resolution eV(Mn K/C): 123 - 133


 

 

Application:

A wide range of applications, including materials, geology, semiconductor, forensics, steel & alloy, biology, etc.

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