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Surface science
IXRF Xb Custom X-Ray Source for EM

The IXRF Xb custom x-ray source is designed exclusively for use on electron microscopes

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Sale area:
  • Hong Kong SAR
  • China

The IXRF Xb custom x-ray source is designed exclusively for use on electron microscopes. The compact design, and slide mounting allow very close coupling to the sample. Patented polycapillary optics focus x-ray excitation down to sample spot size as small as 10μ. The Xb is offered in 10μm and 40μm spot sizes. The integrated high-voltage power supply operates up to a maximum power of 50 watts (35-50 kV and 1.0 mA depending on anode material). The close coupling provides XRF analytical results comparable to those from traditional “’tabletop” or “standalone” units. The Xb is designed so that it does not interfere with the normal operation of the electron microscope, including the use of the electron beam on the same sample, at the same time collecting all elements simultaneously.



Features:

·         Comprehensive software suite

·         Multipoint/Multi-Area Automation

·         Complete Customization Control of Automation

·         50kv/50 watt tube

·         Patented Polycapillary Focusing Optic

·         Spot Size down to 10microns with anti-halo optics

·         Variable control kV/μA, X-ray on/off buttons, kV/μA display, internal interlocked shutter. Interlocked to SEM, keyed power-on switch, HV-On lamp, warning beacon

 

Application:

A wide range of applications, including materials, geology, semiconductor, forensics, steel & alloy, biology, etc.



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