product
- Atomic Force Microscope
- FE-SEM
- Hi-SEM
- Optical Interferometry System
- Sample Preparation
- Tabletop Microscope
- Transmission Electronic Microscope
- X-Ray Spectroscopy
- Fluorescence Spectrophotometer
- Amino Acid Analyzer
- Atomic Absorption Spectrophotometer
- Autotitrator
- Mercury Analyzer
- UV-VIS Spectrophotometer
- High Performance Liquid Chromatography
- Thermal Analyzer
- Automatic Moisture and Ash Content Analyzer
- Fluorescence Spectrophotometer
- Fluorescence Steady State & Life Time / Flash Photolysis
- Mercury Analyzer
- Raman Spectroscopy
- UV-VIS Spectrophotometer
- Mass Spectrometer
- FTIR Spectrometer
- Chromatography Data System
- Gas Chromatography
- Gas Chromatography-Mass Spectrometer (GC-MS)
- Liquid Chromatography
- Sampler and sample pretreatment system
- Column and Consumable
- Amino Acid Analyzer
- Anaerobic & Hypoxic Chambers
- Autoclave & Sterilization
- Biological Safety Cabinets & Clean Benches
- Blood bank & Phamacy Freezer
- Cryopreservation Systems
- DNA & RNA Purification
- Environmental Chambers
- Freezer Dryer
- High Capacity Centrifuge
- High Speed Centrifuge
- Lab Water Purification
- Lab Oven & Incubator
- Life Science
- Mixer
- Pipette
- Tabletop Centrifuge
- Ultracentrifuge
- ULT Freezer
- Temperature Forcing System
- Precisa Analytical Balances
- Precisa Micro Balances
- Precisa Precision Balances 0.001g
- Precisa 520 PB/PT Analytical and Precisa balances
- Preicsa 320 XB Series Balances
- Precisa 165 BJ Series Balances
- Precisa 410 SRS/SRC Series Scale
- Precisa 365 EM/330 XM Moisture Analyzers
- Precisa 490 Series Industrial Scales
- Precisa 321 LX/LS-STB Series Stirrer Balances
- Precisa 321 LG Series Balances
- Standard Balances
Hitachi AFM5100N
Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples.
Download- Hong Kong SAR
Features:
l Simple, sure cantilever installation:
Conventional levers are very small and difficult to grip, but the internal sensor type lever is large, easily gripped, and installation is simple.
l Self-detection method of laser optic axis adjustment unnecessary
With the optic lever method, adjustment is required to align the laser axis to the cantilever but this is not required if employing the self-detection method.
l Accurate positioning by pin-point type cantilever
The cantilever is structured to allow verification from directly above the position of the probe tip. Positioning of measurement spots is easy. Further, high resolution is achieved by sharpening the probe.
l Easy operation by Navigation System
Anybody can smoothly observe high resolution surfaces with the flow chart format navigation system. Further, by intuitively answering questions of sample hardness or roughness, measurement parameters can be easily set.
l Small form factor for flexible, efficient space usage
l Superior Function Expandability
Various
functions can be expanded by adding alignment of the optic lever method. Also,
change to the light lever method is completed by inserting one cable.
Specifications:
Specifications |
AFM5100N |
Optional Accessories |
Manual Stage |
XY ±2.5mm |
Impact Stage |
Sample Size |
35mm (diameter) |
2inch Adjustment
Block |
Scan Range |
20μm×20μm×1.5μm |
Closed Loop Scanner |
Detection |
Self-Detection |
|
Optical
Microscope |
Microscope with
Cover |
|
Vibration
Isolation |
Tabletop |
|
Temperature Control |
|
In air: from R.T.
to 250°C |
In Liquid |
|
? |
Application:
Application areas: Semiconductor, Materials science, Life science.