product
- Atomic Force Microscope
- FE-SEM
- Hi-SEM
- Optical Interferometry System
- Sample Preparation
- Tabletop Microscope
- Transmission Electronic Microscope
- X-Ray Spectroscopy
- Fluorescence Spectrophotometer
- Amino Acid Analyzer
- Atomic Absorption Spectrophotometer
- Autotitrator
- Mercury Analyzer
- UV-VIS Spectrophotometer
- High Performance Liquid Chromatography
- Thermal Analyzer
- Automatic Moisture and Ash Content Analyzer
- Fluorescence Spectrophotometer
- Fluorescence Steady State & Life Time / Flash Photolysis
- Mercury Analyzer
- Raman Spectroscopy
- UV-VIS Spectrophotometer
- Mass Spectrometer
- FTIR Spectrometer
- Chromatography Data System
- Gas Chromatography
- Gas Chromatography-Mass Spectrometer (GC-MS)
- Liquid Chromatography
- Sampler and sample pretreatment system
- Column and Consumable
- Amino Acid Analyzer
- Anaerobic & Hypoxic Chambers
- Autoclave & Sterilization
- Biological Safety Cabinets & Clean Benches
- Blood bank & Phamacy Freezer
- Cryopreservation Systems
- DNA & RNA Purification
- Environmental Chambers
- Freezer Dryer
- High Capacity Centrifuge
- High Speed Centrifuge
- Lab Water Purification
- Lab Oven & Incubator
- Life Science
- Mixer
- Pipette
- Tabletop Centrifuge
- Ultracentrifuge
- ULT Freezer
- Temperature Forcing System
- Precisa Analytical Balances
- Precisa Micro Balances
- Precisa Precision Balances 0.001g
- Precisa 520 PB/PT Analytical and Precisa balances
- Preicsa 320 XB Series Balances
- Precisa 165 BJ Series Balances
- Precisa 410 SRS/SRC Series Scale
- Precisa 365 EM/330 XM Moisture Analyzers
- Precisa 490 Series Industrial Scales
- Precisa 321 LX/LS-STB Series Stirrer Balances
- Precisa 321 LG Series Balances
- Standard Balances
Ultra-High-Resolution Schottky Scanning Electron Microscope
SU7000 provides improved signal separation of secondary electrons and back-scattered electrons through innovative technologies including a brand-new detector specifically designed to enhance precision as well as increase throughput. SU7000 enables users to simultaneously acquire several different signals without changing the working distance. It effectively streamlines observation and analysis whereby reducing time input. Additionally, it is equipped with a large specimen chamber and 18 accessory ports, allowing for high performance with even greater versatility.
Download- Hong Kong SAR
Hitachi Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000
The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous multi-signal collection. Hitachi SU7000 is designed to address these aspects and more by delivering enhanced information for diversified needs in the field of electron microscopy.
Features:
· Capable of simultaneous observation of secondary electrons, back-scattered electrons, and X-ray analysis under one working distance setting.
· Detects and displays up to six different types of signals at the same time.
· Acquires image data at a maximum pixel resolution of 10,240 x 7,680.
· Features 18 accessory ports, the largest number in its class
· Available with variable-pressure mode down to 300 Pa (optional)
Main Specifications:
Items |
Description |
Electron source |
ZrO/W Schottky type emitter |
Secondary electron resolution |
0.8 nm (accelerating voltage 15 kV) 0.9 nm (accelerating voltage 1 kV) |
Accelerating voltage |
0.1 to 30 kV |
Magnification |
20 to 2,000,000 X |
Irradiation current |
Up to 200 nA |
Specimen stage |
X/Y/Z : 135 x 100 x 40 (mm) |
Application: Metal, Material Science, Semiconductors, EBSP analysis