product
- Atomic Force Microscope
- FE-SEM
- Hi-SEM
- Optical Interferometry System
- Sample Preparation
- Tabletop Microscope
- Transmission Electronic Microscope
- X-Ray Spectroscopy
- Fluorescence Spectrophotometer
- Amino Acid Analyzer
- Atomic Absorption Spectrophotometer
- Autotitrator
- Mercury Analyzer
- UV-VIS Spectrophotometer
- High Performance Liquid Chromatography
- Thermal Analyzer
- Automatic Moisture and Ash Content Analyzer
- Fluorescence Spectrophotometer
- Fluorescence Steady State & Life Time / Flash Photolysis
- Mercury Analyzer
- Raman Spectroscopy
- UV-VIS Spectrophotometer
- Mass Spectrometer
- FTIR Spectrometer
- Chromatography Data System
- Gas Chromatography
- Gas Chromatography-Mass Spectrometer (GC-MS)
- Liquid Chromatography
- Sampler and sample pretreatment system
- Column and Consumable
- Amino Acid Analyzer
- Anaerobic & Hypoxic Chambers
- Autoclave & Sterilization
- Biological Safety Cabinets & Clean Benches
- Blood bank & Phamacy Freezer
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- Freezer Dryer
- High Capacity Centrifuge
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- Lab Water Purification
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- Life Science
- Mixer
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- Temperature Forcing System
- Precisa Analytical Balances
- Precisa Micro Balances
- Precisa Precision Balances 0.001g
- Precisa 520 PB/PT Analytical and Precisa balances
- Preicsa 320 XB Series Balances
- Precisa 165 BJ Series Balances
- Precisa 410 SRS/SRC Series Scale
- Precisa 365 EM/330 XM Moisture Analyzers
- Precisa 490 Series Industrial Scales
- Precisa 321 LX/LS-STB Series Stirrer Balances
- Precisa 321 LG Series Balances
- Standard Balances
Hitachi SU-70
The Hitachi SU-70 Analytical Field Emission SEM combines the field proven stability, high current and brightness of the Schottky electron source with the ultra-high resolution required in a multitude of analytical applications. Designed with a semi-in-lens optical configuration, Hitachi's patented ExB technology provides a unique electron signal filtering and mixing system suited for today's demanding applications for research and development and multidiscipline studies. The SU-70 offers an industry-leading technology, quality, and reliability.
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l Ultra High Resolution Imaging; 1 nm/15 kV, 1.6 nm/1 kV (with Beam Deceleration Mode)*
l In-lens SE and BSE Signal Filtering and Mixing Mode
l Sub Nanometer Level Surface Observation at Ultra Low Accelerating Voltages, Provides high resolution, sub nanometer level surface observation at ultra-low accelerating voltages down to 100 V by utilizing the electron beam deceleration function.
l Maximum Probe Current of 100 nA or Greater Available with the Field Proven Schottky Electron Source. High current and high resolution conditions are optimized for analytical techniques such as EDS*, WDS*, EBSP*, CL*, and e-Beam lithography* for increased productivity and throughput.
l EBSP Analysis In Field Free (FF) Mode: Hitachi's unique FF mode eliminates the projected magnetic field of the objective lens associated with semi-in-lens technology, and thereby eliminates artifacts during analysis of magnetic samples and with EBSP* applications.
l Large Analytical Specimen Chamber: Designed to optimize the simultaneous analysis of a wide variety of analytical techniques such as EDS*, WDS*, EBSP*, CL* and e-Beam Lithography* by optimizing the analytical detector solid angle and maintaining high resolution.