Rigaku NEX DE VS with integrated camera and variable small spot analysis

Energy dispersive X-ray fluorescence (EDXRF) is a routinely used analytical technique for the qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types. The heart of its versatility stems from the ability to provide rapid, non-destructive, multi-element analyses — from low parts-per-million (ppm) levels to high weight percent (wt%) concentrations — for elements from sodium (11Na) through uranium (92U). The versatile Rigaku NEX DE VS EDXRF spectrometer delivers routine elemental measurements across a diverse range of matrices — from homogeneous liquids of any viscosity to solids, thin films, alloys, slurries, powders and pastes.

Elemental analysis in the field, plant or laboratory

Specially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE VS adds to its broad appeal for an ever expanding range of applications, including exploration, research, RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE VS is the reliable choice for routine elemental analysis.


Point Analysis interface, available in a variety of languages, is used for small spot measurements. A live camera display is shown in the left window.