Scanning Electron Microscopes SU3800/SU3900
Hitachi electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
DownloadHitachi Scanning Electron Microscopes SU3800/SU3900
The modern SEMs must be highly versatile and easy to use for all experience levels. Hitachi SU3800/SU3900 were designed to address these needs and more, Hitachi High-Technologies provides a novel solution with the SU3800/SU3900. Advanced automation functions including auto start, wide-angle camera navigation with stitching, and auto algorithms enable high-throughput, easy-to-use systems for both new and experienced operators. The oversized SU3900 features a class-leading specimen chamber/stage configuration with ability to accommodate a 300-mm sample diameter and loading capacity up to 5 kg. This allows for easy observation of very large samples without the need to cut or process prior to imaging
Main Features
(1) Handles large, heavy specimens
- The SU3800 can accommodate a specimen up to a 200-mm diameter with maximum height of 80 mm and weight of 2 kg.
- The SU3900 can accommodate a specimen up to a 300-mm diameter with maximum height of 130 mm and weight of 5 kg.
(2) Support for wide-area observations
- SEM MAP with camera navigation supports quick ROI targeting from wide-angle optical image.
- Multi Zigzag function allows for multi-frame stitch acquisition at user-selectable regions of interest, even from SEM MAP optical image.
(3) Improved operation through automation
- The automatic function for image adjustment reduces waiting time from start to acquisition.
- Intelligent Filament Technology (IFT) software automatically monitors and controls filament conditions as well as indicates the remaining filament life. This is advantageous for continuous observation over a long period of time or wide-area particle analysis.
Main Specifications:
|
Items |
|
Description |
|
Secondary Electron Image Resolution |
3.0 nm (Accelerating Voltage: 30 kV, high vacuum mode) 15.0 nm (Accelerating Voltage: 1 kV, high vacuum mode) |
|
|
Backscattered Electron Image Resolution |
4.0 nm (Accelerating Voltage: 30kV, low vacuum mode) |
|
|
Accelerating Voltage |
0.3 to 30 kV |
|
|
Magnification |
×5 to ×300,000 (photo magnification) ×7 to ×800,000 (actual display magnification) |
|
|
Specimen Stage |
X: 0 to 100 mm Y: 0 to 50 mm Z: 5 to 65 mm T: -20° to 90° R: 360° |
X: 0 to 150 mm Y: 0 to 150 mm Z: 5 to 85 mm T: -20° to 90° R: 360° |
|
Maximum Loadable Specimen Size |
200 mm diameter |
300 mm diameter |
|
Maximum Observable Range |
130 mm diameter (with rotation) |
200 mm diameter (with rotation) |
|
Maximum specimen height |
80 mm (WD = 10 mm) |
130mm (WD = 10 mm) |
Product Video
Application: Metallic Materials, Ceramic Materials,
Electronic Materials, Biology/Pharmaceutical Materials