Hitachi SU3500
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems to provide unparalleled imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at low pressures. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. The SU3500 is sure to be the workhorse in any laboratory.
DownloadFeatures:
l Unparalleled Image Quality: 7 nm SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.
l Intuitive Operation: Wide-screen GUI and fast auto image optimization functions (7 seconds) via "delegation" technology. "Best-in-class" Auto Start Functions (Focus, Brightness, Contrast, and Stigmation) for unmatched operational ease and efficiency.
l Low kV and Low Vacuum Performance: The Hitachi "Hex-Bias" probe current optimization technology combined with the all new Ultra Variable-Pressure (UVD) detector offers superior imaging and surface information at low accelerating voltages and low vacuum conditions.
l Live Stereoscopic Imaging: Our advanced
tilted-beam-scan technology enables point and click, real-time "3D"
image observation (show 3D pictures from flyer).
Video Introduction