Hitachi FlexSEM1000
The FlexSEM 1000 Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled imaging and analytical performance in a lab-friendly configuration. Cutting-edge technology and circuitry provides unrivaled imaging performance, even in variable-pressure environments, a feature previously only available in a full-sized SEM. Keeping efficiency in mind, the FlexSEM features an adaptable, separable, and compact design, such that it can be installed in limited office, laboratory, or even mobile spaces. DownloadFeatures:
l Good resolution of 4nm at 20kV
l High sensitivity semiconductor BSE detector
l Pre-centered cartridge filament
l Compact slim body (450 mm wide)
l Designed with separable units for flexible system placement.
l Accurate and fast Auto Focus Control (AFC) and Auto Brightness and Contrast Control (ABCC) algorithms, take only 5 seconds to enable optimized imaging performance with minimal time and effort.
l Newly developed electron optical column and Ultra-Variable-Pressure Detector (UVD), enable superior imaging of specimen surfaces at low-accelerating-voltages and low-vacuum conditions.
l Novel navigation function- "SEM MAP", makes traversing across an entire specimen effortless. Navigate your sample with the use of an optical camera, and deliver accurate correlated Optical and SEM images using only one click.
l New & Improved Auto Functions. The user interface is easy to operate even by novice users, and with the various automated functions, high-quality and quick data acquisition can be accomplished regardless of user experience level.