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Application notes
Measurement of quantum yield in-plane distribution with EEM View

A Spectrofluorometric microscope (EEM View) system can observe samples and acquire spectra. Using an integrating sphere, samples can be observed under uniform lighting condition. The fluorescence spectrum is acquired by the fluorescence-side camera until at the lower part of the integrating sphere.

The quantum yield, an indicator of the luminous efficiency of a fluorescent sample, is calculated from the amount of excitation light absorbed and the amount of fluorescent emission. This instrument can determine the in-plane distribution of quantum yield by calculating the amount of absorption from the sample reflection image and the amount of fluorescence from the fluorescence image.


1.      Determination of in-plane distribution of quantum yield

The absorption distribution is determined from the white board image and the reflection image.

The fluorescence distribution is determined from the fluorescence image.

The in-plane distribution of quantum yield is calculated from the absorption and fluorescence distributions.



2.      Fluorescence spectrum separation and calculation of in-plane distribution of quantum yield for multiple colored samples

When multiple fluorescence substances are present, a PARAFAC treatment is performed and the components are separated.

As a pseudo-sample of composite fluorescent materials, the in-plane distribution of quantum yield was measured for a fluorescent sheet with two colors.






Reflection and Fluorescence image separation and calculation of the in-plane distribution of quantum yield for multiple colored samples.







Multiple captured images were separated into reflection and fluorescence components.

The in-plane distribution of quantum yield, which is an indicator of the luminous efficiency of a fluorescent material was calculated.

The quantum yield was approximately 60% in the yellow region and approximately 35% in the red region.

The in-plane distribution of quantum yield for a sample can be determined using this method.


For more information on Hitachi FL, please visit Hitachi High-Tech Science website

https://www.hitachi-hightech.com/global/products/science/ai/

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